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j m lauenstein m c casey k a label single event in sudan

Single-Event Effect Testing of the Cree C4D40120D Commercial

Single-Event Effect Testing of the Cree C4D40120D Commercial 1200V Silicon Carbide Schottky DiodeLauenstein, J.MCasey, M. C

2015 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE - PDF

[0:55] Session J Hardening by Design :30 2:[:30] Session C Single Event Effects: Devices Lauenstein, A. D. Topper 2, K. A. LaBel

Single-Event Threats for Diodes - Its Not Just Schottky Diodes

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

Single-Event Effect Testing of the Vishay Si7414DN n-Type

Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFETLauenstein, J.MCasey, M. C

Situation in Sudan

Situation in SudanTom Casey

Destructive Single-Event Effects in Diodes

Destructive Single-Event Effects in DiodesCampola, Michael JPhan, Anthony MLabel, Kenneth ACasey, Megan CLauenstein, JeanMarie

Single-Event Threats for Diodes - It%27s Not Just Schottky

Single-Event Threats for Diodes - It%27s Not Just Schottky DiodesCasey, Megan CLauenstein, JeanMarieWilcox, Edward PPhan, Anthony MLaBel, Kenneth A

casey m c 2017

(REDW) - Compendium of Current Single Event Effects Results from NASA Casey, Megan C.Lauenstein, Jean MarieWyrwas, Edward J.Guertin, Steven M

casey m c 2016

LaBel, Kenneth A.Szabo, Carl M.Chen, DakaiCampola, Michael J.Casey, Megan C.Lauenstein, Jean-MarieWilcox, Edward P.Ladbury, Raymond L

Noise propagation in resolution modeled PET imaging and its

(c) iterative deconvolution methods (Teo et al.one transitions from K1 and K2 to K3, one relation to detected events along a particular LOR

called single event: Topics by Science.gov

A means and method for single event time of flight mass spectrometry for Casey, Megan C.; Lauenstein, Jean-Marie; Campola, Michael J.; Wilcox,

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M. Neumark, and S. R. Leone, Transient carbon K and chlorine L2,3 X-ray edges, J.R. Leone, Generating high-contrast, near single

[IEEE 2011 IEEE Radiation Effects Data Workshop (in

Campola, Michael J.Carts, Martin A.Casey, Megan C.Chen, DakaiLaBel, Kenneth A.Ladbury, Raymond L.Lauenstein, Jean-Marie

[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in

(REDW) - Compendium of Recent Single Event Casey, Megan C.Topper, Alyson D.LaBel, KennethLauenstein, Jean-MarieGigliuto, Robert A

single event study: Topics by WorldWideScience.org

single event upset (SEU) of semiconductor devices the relative transverse momentum k t at the M.; Fulcher, J.R.; Hall, G.; Huhtinen,

[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in

doi:10.1109/REDW.2013.6658205Lauenstein, Jean-MarieTopper, Alyson D.Casey, Megan C.Wilcox, Edward P.Phan, Anthony M.Kim, Hak S.LaBel, Kenneth A

Session C - IEEE NSREC 2019

neutron-induced single-event effects should be lowered from 10 MeV to 1 J.-M. Lauenstein, M. C. Casey, R. L. Ladbury, K. A. LaBel, NASA

Single-Event Effects in Silicon Carbide Power

J.-M. Lauenstein, M. C. Casey, K. A. LaBel, S. Ikpe, A. D. Topper, E. P. Wilcox, H. Kim and A. M. Phan, Single-Event Effects in

Lessons Learned and Guideline Documents

2016223-Power Devices by Jean-Marie Lauenstein, Megan C.Casey, Alyson J. Topper, Edward T. Wilcox, LaBelSingle-Event Effects Induced by Pulsed